HIOKI (FLYING PROBE TESTER) FA1240-6x – NDTC
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Probe/Circuit tester

HIOKI (FLYING PROBE TESTER) FA1240-6x

Hioki PCB and substrate inspection equipment leverages our core competency in high precision component testing. The FA1240 series is a 4-arm populated board inspection tool that delivers multi-functional testing in as fast as 0.025 sec./step.

Features

  • Key features
    • Quickly complete programs that take into account component height
    • Automatically calculate arm interference (when used with the UA1780)
    • Designed to improve probe replaceability, dramatically reducing system downtime caused by probe replacement
    • High-speed testing at up to 0.025 sec./step
    • Detect IC lead float and pseudo-contact states
    • Support for active testing (optional feature)
    • High-precision probing
    • Large testing area of 510 × 460 mm (FA1240-61)
    • Standard transport capability
    • Automatic alignment function and simple visual test function

Downloads

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