HIOKI (IN-CIRCUIT TESTER) FA1220-02 – NDTC
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Probe/Circuit tester

HIOKI (IN-CIRCUIT TESTER) FA1220-02

Hioki testing systems continue to evolve so that the people who use them can shine. Reflecting its commitment to bring speed and comfort to the production floor by streamlining testing, Hioki’s proud to introduce a populated board tester designed with people in mind.

Features

  • Key features
    • Slide-in mechanism simplifies installation and removal of test fixtures, reducing man-hours and workload.
    • Extension range of options that reduces setup man-hours and boosts productivity.
    • Numerous measurement parameters and detecting defects for a wide variety of inspections.
    • Productivity, quality, and safety.
    • Data creation support functionality: ATG function.

Downloads

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