HIOKI (FLYING PROBE TESTER) FA1283 – NDTC
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Probe/Circuit tester

HIOKI (FLYING PROBE TESTER) FA1283

Features

  • Key features
    • High-precision probing □20 μm / □15 μm (when using FA1971-01)
    • Max.100 points/s ultra-high speed inspection
    • Reliable clamping of thin boards with tension function
    • High-speed insulation testing of up to 100GR.
    • Minute resistance measurement of IVHs and through-holes.
    • Measure with high applied currents of up to 200mA,which is close to current ratings for fine patterns
    • Large testing area of 400×324 mm
    • Inline function(optional feature)
    • LSI reliability testing(optional feature)

Downloads

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